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WI-5000 automatic detector | Case 1:BGA welding ball size detection | Case 2:Connector size detection |
LED device detection project | Appearance detection of LED devices | Height and coverage of microchip silver pulp | Welding line arc height and quality |
Serial number | Industry | Picture | WI measurement | WI 3D measurement |
1 | LED | |||
2 | Welding | |||
3 | Copper plate | |||
4 | FPC | |||
5 | Wafer | |||
6 | Engraved | |||
7 | Coil | |||
8 | Button | |||
9 | Mobile phone frame | |||
10 | Gumming | |||
11 | Chip packaging |
Serial number | Industry | Picture | WI measurement | WI 3D measurement |
12 | PCB | |||
13 | Hardware components | |||
14 | Buzzer | |||
15 | Camera | |||
16 | Screw hole | |||
17 | Building materials surface | |||
18 | Camera lens | |||
19 | Test paper | |||
20 | Gumming | |||
21 | Wire harness | |||
Please contact us for other applications. |
3D visual camera | Dual camera system | DB/WB recognition program | Molding decision program | Testing interface |
Visual inspection project |
Wafer visual inspection |
DB&WB visual inspection |
Post road visual inspection |
Visual inspection of final test |
Testing station | The quality of the wafer appearance,wafer sawing |
Die bond |
Molding Electroplating, ball planting, cutting, etc. |
Final Testing |
Detectable content | Wafer size,angle Graphical character Defect detection such as Scratches, Pits Pollution, fragmentation |
DB:Chip size detection, appearance defect detection, missing, position deflection, flatness, silver paste weight, climb WB:Line arc defects collapse, line break, thread break, tail warping, line skew, line arc too high, leakage welding, etc. |
Molding/Trim/Form:Plastic material is not fully filled, frame distortion, dislocation, chromatic aberration, porosity, damage, pin deformation, product direction, etc. Plating electroplating:During the production process, the location of material and the direction of material installation, location and size of plating are detected. |
Marking lettering:Lettering, inscription, direction, depth Testing:Bend, damage, deflection, device surface defects, scratches, holes, stacking, tilt, direction, etc. |