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WI-5000 automatic detector | Case 1:BGA welding ball size detection | Case 2:Connector size detection |
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LED device detection project | Appearance detection of LED devices | Height and coverage of microchip silver pulp | Welding line arc height and quality |
Serial number | Industry | Picture | WI measurement | WI 3D measurement |
1 | LED | ![]() |
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2 | Welding | ![]() |
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3 | Copper plate | ![]() |
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4 | FPC | ![]() |
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5 | Wafer | ![]() |
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6 | Engraved | ![]() |
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7 | Coil | ![]() |
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8 | Button | ![]() |
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9 | Mobile phone frame | ![]() |
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10 | Gumming | ![]() |
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11 | Chip packaging | ![]() |
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Serial number | Industry | Picture | WI measurement | WI 3D measurement |
12 | PCB | ![]() |
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13 | Hardware components | ![]() |
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14 | Buzzer | ![]() |
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15 | Camera | ![]() |
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16 | Screw hole | ![]() |
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17 | Building materials surface | ![]() |
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18 | Camera lens | ![]() |
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19 | Test paper | ![]() |
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20 | Gumming | ![]() |
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21 | Wire harness | ![]() |
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Please contact us for other applications. |
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3D visual camera | Dual camera system | DB/WB recognition program | Molding decision program | Testing interface |
Visual inspection project |
Wafer visual inspection |
DB&WB visual inspection |
Post road visual inspection |
Visual inspection of final test |
Testing station | The quality of the wafer appearance,wafer sawing |
Die bond |
Molding Electroplating, ball planting, cutting, etc. |
Final Testing |
Detectable content | Wafer size,angle Graphical character Defect detection such as Scratches, Pits Pollution, fragmentation |
DB:Chip size detection, appearance defect detection, missing, position deflection, flatness, silver paste weight, climb WB:Line arc defects collapse, line break, thread break, tail warping, line skew, line arc too high, leakage welding, etc. |
Molding/Trim/Form:Plastic material is not fully filled, frame distortion, dislocation, chromatic aberration, porosity, damage, pin deformation, product direction, etc. Plating electroplating:During the production process, the location of material and the direction of material installation, location and size of plating are detected. |
Marking lettering:Lettering, inscription, direction, depth Testing:Bend, damage, deflection, device surface defects, scratches, holes, stacking, tilt, direction, etc. |